<?xml version="1.0" encoding="UTF-8"?>
<metadata
  xmlns="http://example.org/myapp/"
  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
  xsi:schemaLocation="http://example.org/myapp/ http://example.org/myapp/schema.xsd"
  xmlns:dc="http://purl.org/dc/elements/1.1/"
  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001 /</dc:Title>
<dc:Title>ATS 2001 compendium</dc:Title>
<dc:Creator>IEEE Computer Society.</dc:Creator>
<dc:Creator>Asian Test Symposium.</dc:Creator>
<dc:Subject>Electronic digital computers</dc:Subject>
<dc:Subject>Electronic circuits</dc:Subject>
<dc:Subject>Fault-tolerant computing</dc:Subject>
<dc:Subject>621 IEE 2001 A051 Or.</dc:Subject>
<dc:Description>"ATS 2001 compendium"--Half T.p.</dc:Description>
<dc:Description>"IEEE Computer Society Order Number PR01233"--T.p. verso.</dc:Description>
<dc:Publisher>Los Alamitos, Calif. : IEEE Computer Society,</dc:Publisher>
<dc:Date>c2001.</dc:Date>
<dc:Date>c2001.</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xii, 374 p. :</dc:Format>

</metadata>