<?xml version="1.0" encoding="UTF-8"?>
<mods xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3" version="3.1" xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-1.xsd">
  <titleInfo>
    <title>10th anniversary compendium of papers from Asian Test Symposium</title>
    <subTitle>proceedings : 1992-2001</subTitle>
  </titleInfo>
  <titleInfo type="alternative">
    <title>ATS 2001 compendium</title>
  </titleInfo>
  <name type="corporate">
    <namePart>IEEE Computer Society</namePart>
  </name>
  <name type="corporate">
    <namePart>Asian Test Symposium</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Los Alamitos, Calif</placeTerm>
    </place>
    <publisher>IEEE Computer Society</publisher>
    <dateIssued>c2001</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>xii, 374 p. : ill. ; 28 cm.</extent>
  </physicalDescription>
  <note>"ATS 2001 compendium"--Half T.p.</note>
  <note>"IEEE Computer Society Order Number PR01233"--T.p. verso.</note>
  <subject authority="lcsh">
    <topic>Electronic digital computers</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Electronic circuits</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Fault-tolerant computing</topic>
  </subject>
  <classification authority="ddc">621 IEE 2001 A051 Or.</classification>
  <identifier type="isbn">076951233X</identifier>
  <identifier type="isbn">0769512348 (case)</identifier>
  <identifier type="isbn">0769512356 (microfiche)</identifier>
  <recordInfo>
    <recordContentSource authority="marcorg"/>
  </recordInfo>
</mods>
